Semiconductor IC Testing Pogo Pin Tower

Semiconductor IC testing Pogo pin Tower

Semiconductor IC testing Pogo pin Tower combines with Testing Pogo pin connector and pogo pins.

Semiconductor IC testing Pogo pin Tower

Fully compatible with existing probe towers：360/900 / 1,080 / 1,320 / 1,620 / 2,070 pins. An 18-pin module with 90 signal pins per single module and a 10-pin module with 45 signal pins per single module.

Application space: 224 square centimeters and 114 square centimeters

Semiconductor IC testing Pogo pin Tower: Expand application space, Pin module design, Freely configurable space, Various pogo pin module solutions can be provided according to customer needs-configurable 800 to 4,800 pins.

Semiconductor IC testing Pogo pin Tower 

Certification of contact resistance measurement to ensure excellent performance. Debugging tools, Probe tower position test tool, Node location check tool.

Semiconductor IC testing Pogo pin Tower

The modular structure makes the pogo pin and spring block easy to expand and replace, and easy to maintain. Compatible with all traditional PIB boards and standard probe stations. More economical, advanced, and innovative interface solutions With cover for a low-temperature test.

Semiconductor IC testing Pogo pin Tower 

the precision test probe is a test probe, which is an indispensable part of the process of precision electrical testing. In the process of R&D and production of electronic circuits, it is often necessary to test and analyze the continuity and quality of the signal. At this time, it is necessary to use a precision test probe to take out the signal without loss and provide it to the corresponding ICT or test system for integrated analysis. 

Semiconductor IC testing Pogo pin Tower

According to the application fields of test probes, test probes are divided into conventional ICT probes, semiconductor test probes, RF high-frequency test probes, high-current probes, and battery contact probes. It can also be divided into conventional single-ended pogo pins, double-ended BGA test needles, and needle sleeve adapter double-ended needles.

Semiconductor IC testing Pogo pin Tower

In the early stage of probe selection, several parameters that need to be considered are the distance of the test probe, the selection of the appropriate head type of the object to be tested, the current carried by the test, the stroke of the test movement, and the elastic force that needs to be selected, etc.

Hot Tags: semiconductor ic testing pogo pin tower, China, suppliers, manufacturers, factory, customized, wholesale, buy, bulk, in stock, free sample