Spring probes, also known as Pogo pins, are spring-loaded contacts that are used in electronic test fixtures to establish a connection between the test fixture and the device under test (DUT). They are used for testing printed circuit boards (PCBs) and other electronic components. The probes are designed to contact the DUT’s test points and provide a reliable electrical connection. They are available in various lengths, diameters, and plunger types to accommodate your needs.

Spring probes and Pogo pins are the same things. They are spring-loaded contacts that are used in electronic test fixtures to establish a connection between the test fixture and the device under test (DUT). They are used for testing printed circuit boards (PCBs) and other electronic components. The probes are designed to contact the DUT’s test points and provide a reliable electrical connection. They are available in various lengths, diameters, and plunger types to accommodate your needs.
Spring probes or pogo pins are used in many applications including medical devices, consumer electronics, robotics, and PCB testing. They are mainly used to rectify circuits and establish conductive connections and signal communication.

Spring probes or pogo pins are used in electronic test fixtures to establish a connection between the test fixture and the device under test (DUT). They are used for testing printed circuit boards (PCBs) and other electronic components. The probes are designed to contact the DUT’s test points and provide a reliable electrical connection. They are available in various lengths, diameters, and plunger types to accommodate your needs.

To use spring probes or pogo pins, you need to first determine the type of probe you need for your application. You can select the appropriate probe based on its length, diameter, and plunger-type. Once you have selected the probe, you can then insert it into the test fixture and make contact with the DUT’s test points.

Spring probes or pogo pins have been used in electronic test fixtures for many years. They were first developed to provide a reliable electrical connection between the test fixture and the device under test (DUT). They are used for testing printed circuit boards (PCBs) and other electronic components.