High Frequency 5G Spring Probe

High frequency 5G Spring Probe

High frequency 5G Spring Probe usually contains three components. These parts must be manufactured as precisely as required by the microelectronics field. 

The needle plunger part is mainly used for connection and can be used with all kinds of needles. And as much as possible to produce a smaller contact resistance between the test probe and the test point to ensure the authenticity of the test results. As the needle material, steel and beryllium copper are mainly used, which are respectively hardened. If the needle shape is very blunt, brass material can also be used. 

As an effective component, the spring can ensure the necessary contact force even after hundreds of thousands of overlaps (test cycle). The rated spring force specified in the product catalog can be achieved under the recommended working stroke, but due to the influence of factors such as structure, manufacturing tolerances and use conditions, there will be slight fluctuations. 

High frequency 5G Spring Probe The needle sleeve supports the needle and the spring. The measurement signal is transmitted to the probe needle cover. In order to optimize performance, in addition to gold-plating the needle sleeve, a thin organic protective layer can also be coated. The probe needle cover (KS) is used to facilitate the replacement of the test probe when maintaining the test fixture. Can be replaced quickly, and no wiring work is required. To this end, a curling position is provided on the side. During this period, it should be noted that the crimping point can only achieve its better function after the casing is installed in the borehole. That is to say, the probe must be inserted into the probe card after the needle is set. 

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